Abbrevation
VTS
City
Napa Valley
Country
United States
Deadline Paper
Start Date
End Date
Abstract
Annual symposia that explore the state–of–the–art, and introduce innovative approaches, in the testing of electronic circuits and systems. <b>Keywords:</b> Analog, M–S & RF Testing, Embedded Core Testing, On–Line Testing, Automatic Test Generation, Embedded Test Methods, System–on–Chip (SOC) Test, Built–In Self–Test (BIST), Fault Modeling & Simulation, Test Resource Partitioning, Current Based Testing, MEMS Testing, Thermal Testing, Delay Testing, Memory Test, Test Quality & Reliability, Design for Testability, Microprocessor Testing, Test Self–Checking Circuits, Design Verification/Validation, Multi–Chip Module Testing, System Test