The IEEE Latin–American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world, to present and discuss various aspects of system, board and component testing and fault–tolerance with design, manufacturing and field considerations in mind. <b>Keywords:</b> Analog and Mixed Signal Test – Fault–Tolerant Systems Applications, Automatic Test Generation – IDDQ Test, Built–In Self–Test – On–Line Testing, Defect & Failure Analysis – Process Characterization, Reliability, Dependability Estimation – Process Control and Measurements, Distributed Fault–Tolerant Systems – Simulation and Design Verification, E–Beam Testing & Thermal Testing – Software Design for Test, Economics of Test – Software Testing, Fault Modelling & Diagnosis – Synthesis for Testability/Design for Test, Fault Simulation – System–On–Chip Test, Fault–Tolerant Architectures – Radiation Testing, Fault–Tolerance in Hardware/Software – Yield Learning and Enhancement
Abbrevation
LATW
City
Natal
Country
Brazil
Deadline Paper
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End Date
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