DFT is an annual Symposium providing an open forum, combining new academic research to state–of–the–art industrial data, for discussions on all aspects of design, manufacturing, test, reliability and availability that are affected by defects during manufacturing and by faults during system operation. Topics include defect and fault tolerance issues, error detection and recovery, yield and dependability analysis and modelling, testing techniques, yield enhancement techniques, applications and case studies. <b>Keywords:</b> 1. Yield Analysis and Modeling<br>Defect/Fault analysis and models; statistical yield modeling; critical area and other metrics; on–line data collection; product planning.<br>2. Yield Enhancement<br>IC layout modification for manufacturability; process control and measurement.<br>3. Repair, Restructuring and Reconfiguration<br>Mechanism for fault–isolation, reconfiguration, and repair; restructurable and reconfigurable circuit design; on–line reconfiguration and repair.<br>4. Testing Techniques<br>Built–in self–test in VLSI/WSI; built–in current sensors (BICS)/Iddq testing; delay fault modeling and diagnosis; parametric testing; testing for FPGAs; testing for analog or mixed circuits.<br>5. Error Detection, Correction, and Recovery<br>Self–testing and self–checking design; error– control coding; fault masking logic design; recovery scheme using space/time redundancy.<br>6. Defect and Fault Tolerance<br>Cost–performance analysis of defect and fault tolerance; reliable circuit synthesis; radiation hardened/tolerant processes and design techniques; delay defect/fault tolerance.<br>7. Dependability Analysis and Validation<br>Fault injection techniques and environments; dependability characterization of integrated circuits and systems.<br>8. Case Studies and Applications<br>Giant integration by MCM/WSI; design for defect and fault tolerance in specific circuits; design for fault tolerance in processors, memories, networks, signal processing systems, FPGA–based systems and embedded systems; fault tolerance in automotive, railway, avionics, industrial control, and space applications.
Abbrevation
DFT
City
Cambridge
Country
United States
Deadline Paper
Start Date
End Date
Abstract