Abbrevation
DFT
City
Cambridge
Country
United States
Deadline Paper
Start Date
End Date
Abstract

DFT is an annual Symposium providing an open forum, combining new academic research to state&#8211;of&#8211;the&#8211;art industrial data, for discussions on all aspects of design, manufacturing, test, reliability and availability that are affected by defects during manufacturing and by faults during system operation&#046; Topics include defect and fault tolerance issues, error detection and recovery, yield and dependability analysis and modelling, testing techniques, yield enhancement techniques, applications and case studies&#046; <b>Keywords:</b> 1&#046; Yield Analysis and Modeling<br>Defect/Fault analysis and models; statistical yield modeling; critical area and other metrics; on&#8211;line data collection; product planning&#046;<br>2&#046; Yield Enhancement<br>IC layout modification for manufacturability; process control and measurement&#046;<br>3&#046; Repair, Restructuring and Reconfiguration<br>Mechanism for fault&#8211;isolation, reconfiguration, and repair; restructurable and reconfigurable circuit design; on&#8211;line reconfiguration and repair&#046;<br>4&#046; Testing Techniques<br>Built&#8211;in self&#8211;test in VLSI/WSI; built&#8211;in current sensors (BICS)/Iddq testing; delay fault modeling and diagnosis; parametric testing; testing for FPGAs; testing for analog or mixed circuits&#046;<br>5&#046; Error Detection, Correction, and Recovery<br>Self&#8211;testing and self&#8211;checking design; error&#8211; control coding; fault masking logic design; recovery scheme using space/time redundancy&#046;<br>6&#046; Defect and Fault Tolerance<br>Cost&#8211;performance analysis of defect and fault tolerance; reliable circuit synthesis; radiation hardened/tolerant processes and design techniques; delay defect/fault tolerance&#046;<br>7&#046; Dependability Analysis and Validation<br>Fault injection techniques and environments; dependability characterization of integrated circuits and systems&#046;<br>8&#046; Case Studies and Applications<br>Giant integration by MCM/WSI; design for defect and fault tolerance in specific circuits; design for fault tolerance in processors, memories, networks, signal processing systems, FPGA&#8211;based systems and embedded systems; fault tolerance in automotive, railway, avionics, industrial control, and space applications&#046;