<P>ITC is the world′s premier conference dedicated to the electronic test of devices, boards and systems, covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. </P> <P><B>Keywords:</B> Conference Focus Topics: BIST or Embedded Test Loadboard Design & Simulation Design–for–Test Experiments and Case Studies High–Speed Digital Test Multisite Test RF Testing System–on–Chip Test Test Resource Partitioning Hot Topics: FPGA Test Interface Issues Practical Test Engineering Test Cost Reduction Techniques Test for Nanometer Technologies Regular Topics: ATE Hardware and Software ATPG, Test Synthesis Board and System Test Boundary–Scan, Economics of Test Defect–based Testing Design Validation Fault Diagnosis and Failure Analysis IDDQ and Current Test MCM and KGD Test, Memory Test Microprocessor Test Mixed–Signal and Analog Test On–line Test Production Test Automation Test Standards Test Effectiveness Test and Reliability Wafer Probe</P>
Abbrevation
ITC
City
Charlotte
Country
United States
Deadline Paper
Start Date
End Date
Abstract