The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to higher quality, more economical, and more efficient testing methodologies and designs. The 12th workshop will focus on ″Test Challenges for the Deep Sub–Micron Era″. <b>Keywords:</b> Analog/Mixed Circuit Testing, Automatic Test Generation, Built–In Self–Test (BIST), Board Level Testing, Defect Oriented Testing, Delay/Performance Testing, Design for Testability, Design Verification/Validation, Diagnosis and Debug, Embedded Core Testing, Fault Modeling/Simulation, IDDQ Testing, Multi–Chip Module Testing, Memory Testing, MEMS Testing, Online Testing, System–on–Chip (SOC) Test, System Testing, Test Economics, Test Quality/System Reliability, Test Resource Partitioning, Test Synthesis
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NATW
City
MontaukNY
Country
United States
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