Abbrevation
ATS
City
Xian
Country
China
Deadline Paper
Start Date
End Date
Abstract
The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. <b>Keywords:</b> Automatic Test Generation, Fault Simulation, Design for Testability, Synthesis for Testability, Built–In Self–Test, On–line Testing, Fault Modeling, Mixed–Signal Test, Design Verification, Economics of Test, Software Testing, Software Design for Test, Electron–Beam Testing, IDDQ Test, System–on–a–Chip Test, Microprocessor Test