Starting from this year the IEEE International On–Line Testing Workshop is transformed to Symposium, to reflect the continues growing in size and improvement in quality of the event, and the increased importance of on–line testing in modern electronics systems. In particularly, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost–effective on–line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. These technologies impact adversely noise margins and make mandatory integrating on–line test in modern ICs. The Symposium is also emphasizing on on–line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips. <b>Keywords:</b> Reliability issues in nanometer technologies, Field diagnosis, maintainability and reconfiguration, Security issues in cryptographic chips, On–line testing in automotive, railway, avionics and industrial control, On–line test in the continuous operation of large systems, On–line testing of analog and mixed signal circuits, Self–checking circuits and coding theory, On–line and off–line BIST, Synthesis of on–line testable circuits, Radiation effects, Fault–tolerant and fail–safe systems, On–line power monitoring and control, On–line monitoring of current, temperature and other reliability indicators, Reliability evaluation
Abbrevation
IOLTS
City
Madeira Island
Country
Portugal
Deadline Paper
Start Date
End Date
Abstract