Abbrevation
ATS
Link
http://larc.ee.nthu.edu.tw/~ats04
City
Kenting
Country
Taiwan
Deadline Paper
Start Date
End Date
Abstract

The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind&#046; <b>Keywords:</b> 1&#046; Test generation & fault simulation<br>2&#046; Design for testability<br>3&#046; Fault diagnosis<br>4&#046; Analog & mixed&#8211;signal testing<br>5&#046; Memory testing<br>6&#046; Wafer&#8211;level testing<br>7&#046; System&#8211;On&#8211;A&#8211;Chip testing<br>8&#046; Integration of design and test<br>9&#046; Software testing<br>10&#046; CPU testing<br>11&#046; Failure analysis & fault modeling<br>12&#046; Built&#8211;in self&#8211;test<br>13&#046; Fault tolerance & error correction<br>14&#046; Functional testing<br>15&#046; IDDQ testing<br>16&#046; Test economics<br>17&#046; P1500 & boundary scan<br>18&#046; Test experience in industry<br>19&#046; Automatic test equipment<br>20&#046; Yield Enhancement