The IEEE European Test Symposium (ETS, previously ETW) is a well–recognized forum for presenting and discussing hot topics, trends, emerging results, and practical applications in the area of electronic–based circuit and system testing. The 2004 edition of the symposium will take place in Ajaccio, Corsica (France). Surrounded by a fantastic mountain range, Ajaccio is located on the shore of one of the most beautiful gulfs in the world. This resort city is well known for both its welcoming tradition and the mildness of its climate. <b>Keywords:</b> Analog, Mixed–Signal, and RF Test, ATE Hardware and Software, ATPG and High–Level TPG, Debug and Diagnosis, Defect/Fault Tolerance and Reliability, Design Verification/Validation, Emerging Testability Standards, Failure Analysis, Defect and Fault Modeling, Fault Simulation, FPGA Test, High–Level DfT, IDDX Test, Low–Cost Testers, Memory and Processor Test, MEMS Testing, On–Line and Off–Line BIST, Scan–Based Techniques and Boundary Scan, Self–Repair Methodologies, Signal Integrity Test, System Test, Test of Embedded Cores and System–on–Chip, Test of MCMs and Boards, Test Resource Partitioning and Embedded Test, Test Synthesis and Synthesis for Testability, Thermal Testing, Yield Analysis and Yield Enhancement
Abbrevation
ETS
City
Ajaccio, Corse
Country
France
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