Abbrevation
BAST
City
Bodega Bay
Country
United States
Deadline Paper
Start Date
End Date
Abstract
The 13th annual BAST workshop, co–sponsored by the Stanford University Center for Reliable Computing (CRC) and the IEEE Computer Society Test Technology Technical Council (TTTC)*, will be held February 24 – 27, 2004, in Bodega Bay, California. BAST is an informal workshop whose objective is to bring together engineers from the Pacific Northwest to discuss current work on testing electronic circuits. <b>Keywords:</b> SOC and SIP Test Methodology<br>Test Compression<br>Low–cost ATE<br>Validation and Verification<br>Defect Behavior and Detection<br>Mixed Signal Testing<br>Yield Analysis<br>Testing High Speed I/Os<br>Online Test and Robust Designs<br>BIST<br>Diagnosis<br>Debug