International Workshop on Defect Based Testing, Napa Valley, Vereinigte Staaten

The IEEE International Workshop on Current and Defect Based Testing (DBT) is aimed at addressing this question by providing an informal forum for the discussion of key recent advances and open research issues relating to defect based testing and associated test methodologies&#046; The theme of this year’s workshop “Defect Based Testing in Nanometer Technologies” has been selected to generate active discussion on the challenges that must be met to ensure high IC product quality through to the end of the decade&#046; <b>Keywords:</b> Delay Tests and Opens, Shorts and Bridging Defects, IDDQ and IDDT Testing, Low voltage Testing, Elevated Voltage Testing, Stress Testing, Reliability and Yield, Burn In Minimization, Noise and Cross&#8211;talk Testing, Nanometer Test Challenges, DSM Defect Mechanisms, Technology Trends and Testing, Test Generation Tools, Mixed Current/Voltage Testing, Economics of Defect Based Testing, On and Off Chip Current Sensors, Defect Coverage & Metrics, Fault Location & Diagnosis, IDDQ Limit Setting, IDD Testing of Analog/Mixed Circuits