<P>ITC is the world′s premier conference dedicated to the electronic test of devices, boards and systems, covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. </P> <P><B>Keywords:</B> BIST or Embedded Test <BR>Loadboard Design & Simulation<BR>Design–for–Test <BR>Experiments and Case Studies <BR>High–Speed Digital Test<BR>Multisite Test <BR>RF Testing<BR>System–on–Chip Test<BR>Test Resource Partitioning<BR><BR><BR>Hot Topics:<BR>FPGA Test <BR>Interface Issues<BR>Practical Test Engineering <BR>Test Cost Reduction Techniques<BR>Test for Nanometer Technologies<BR><BR><BR>Regular Topics:<BR>ATE Hardware and Software<BR>ATPG, Test Synthesis<BR>Board and System Test <BR>Boundary–Scan <BR>Economics of Test<BR>Defect–based Testing<BR>Design Validation <BR>Fault Diagnosis and Failure Analysis<BR>IDDQ and Current Test<BR>MCM and KGD Test<BR>Memory Test<BR>Microprocessor Test<BR>Mixed–Signal and Analog Test<BR>On–line Test<BR>Production Test Automation <BR>Test Standards<BR>Test Effectiveness<BR>Test and Reliability<BR>Wafer Probe</P>
Abbrevation
ITC
City
Charlotte
Country
United States
Deadline Paper
Start Date
End Date
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