Annual symposia that explore the state–of–the–art, and introduce innovative approaches, in the testing of electronic circuits and systems. <b>Keywords:</b> Analog, M–S & RF Test<br>Automatic Test Generation<br>ATE Architecture & SW<br>Built–In Self–Test (BIST)<br>Current Based Test<br>Defect Tolerance<br>Delay & Performance Test<br>Design for Testability<br>Design Verification/Validation<br>Diagnosis and Debug<br>DFT Testers<br>Embedded Core Test<br>Embedded Test Methods<br>Fault Modeling and Simulation<br>Infrastructure IP<br>MEMS Test<br>Memory Test<br>Microprocessor Test<br>Multi–Chip Module Test<br>Nanometer Technologies<br>On–Line Test<br>Power Issues in Test<br>Self–Repair<br>System–on–Chip (SOC) Test<br>System Test<br>Synthesis for Testability<br>Test Resource Partitioning<br>Thermal Test<br>Test Data Compression<br>Test of High–Speed I/O<br>Test Quality and Reliability<br>Test of Self–Checking Circuits<br>Yield Analysis & Optimization
Abbrevation
VTS
City
Napa Valley
Country
United States
Deadline Paper
Start Date
End Date
Abstract