The SouthWest Test Workshop is the only IEEE/CS sponsored event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. <b>Keywords:</b> New probe card and contactor technologies<br>Challenges of 300–mm wafer probing<br>Monitor and reduction of chip I/O pad damage<br>Area array and C4 solder bump probing<br>Parallel, multi–site probing<br>Productivity improvements for high volume production<br>Probe data collection, analysis, and management<br>Probe Card cleaning and extending card life<br>Advances in Probe Card Analyzers and metrology<br>Addressing unique probing requirements<br>Copper I/O pads, RF and microwave, Mixed signal, low noise, and parametric, Very high frequency digital, Probing for Known Good Die, High power devices, Probe Potpourri (anything goes)
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SWTW
City
San Diego
Country
United States
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