Abbrevation
VLSI-TSA
City
Hsinchu
Country
Taiwan
Deadline Paper
Start Date
End Date
Abstract

The purpose of VLSI&#8211;TSA&#8211;Tech is to bring together scientists and engineers to share the newest research and development results on VLSI technologies such as materials, manufacturing methods, memories, and so forth, while, on the other hand, the VLSI&#8211;TSA&#8211;DAT will provide a forum for presenting new innovations and achievements related to VLSI design, automation and test&#046; <B>Keywords:</B> CMOS, bipolar, and BiCMOS ICs <BR>DRAM, SRAM and nonvolatile memory <BR>SiGe, analog and mixed signal <BR>Merged logic and memory <BR>SOI material and devices <BR>Device and interconnect reliability <BR>Process and device modeling <BR>Advanced lithography technologies <BR>TFT technology <BR>Advanced process technology <BR>Interconnect technology <BR>High&#8211;k and low&#8211;k materials <BR>MEMS <BR>Advanced packaging technology <BR>Organic electronics and photonics <BR>Emerging transistor structures <BR>Nanoelectronic devices / technology <BR>Novel Device Concepts <BR><BR>RF, analog and mixed&#8211;signal circuits <BR>Sensors and iterface circuits <BR>Digital circuits and ASIC <BR>Processors, DSP and array architectures <BR>Memory circuits and systems <BR>Low power circuits, logic and architectures <BR>Circuits for multimedia processing <BR>Circuits for wireless and wireline communications <BR>System&#8211;on&#8211;chip and embedded software <BR>Designs using novel technologies <BR>Design for manufacturablity <BR>Modeling and simulation <BR>Hardware&#8211;software co&#8211;design <BR>Logic and architecture synthesis <BR>Physical design and mixed&#8211;signal design <BR>CAD for RF, analog and mixed&#8211;signal design <BR>Power estimation and optimization <BR>Test generation and fault simulation <BR>BIST and design for testability <BR>RF, analog and mixed&#8211;signal test <BR>System&#8211;on chip testing <BR>System&#8211;in&#8211;package Design