13th Annual Meeting of the IEEE International Symposium The IEEE International Workshop on Electronic Design, Test and Applications (DELTA) is an event in which specialists from all over the world meet and discuss research and engineering problems and results in the emerging areas of electronic design, manufacturing, test, advanced system applications and related areas. <b>Keywords:</b> Design<br>Digital Services, Components and Techniques Analogue Components and Techniques System Architecture, Simulation and Modelling Microprocessors and ASICs MicroPhotonics, Opto–VLSI Power Electronics Multi–Chip Projects Packaging, Practical Realisation & Field Trials Emerging Technologies, Design & Re–Use<br>Applications<br>Communications and Networking Signal Processing Fuzzy Logic and Neural Networks Instrumentation, Measurements and Control Medical Electronics Automotive, Security Real–Time Systems Novel Systems and Applications Multimedia, Education, Technology Transfer<br>Testing<br>System Testing Design Verifications Built–in Self–test Techniques Design for Testability, Boundary Scan Analogue and Mixed–Signal and RF Test Fault–Tolerant and Robustness Concurrent Checking and On–Line Testing Measurement for Reliability and Safety Assessment Characterisation Testing, Performance Modelling and Analysis Sequential Circuits Test and Memory Test
Abbrevation
DELTA
City
Kuala Lumpur
Country
Malaysia
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