VLSI–DAT provides a forum for presenting new innovations and achievements related to VLSI design, automation, and test. <b>Keywords:</b> RF, analog and mixed–signal circuits<br>Sensors and interface circuits<br>Digital circuits and ASIC<br>Processors, DSP and array architectures<br>Memory circuits and systems<br>Low power circuits, logic and architectures<br>Multimedia processing circuits<br>Communication circuits<br>Embedded systems and software<br>Designs using novel technologies<br>System–in–package design<br>Modeling and simulation<br>Hardware–software co–design<br>Logic and architecture synthesis<br>Physical design and verification<br>Design for manufacturability<br>Power estimation and optimization<br>Design verification<br>Test generation and fault simulation<br>BIST and design for testability<br>RF, analog and mixed–signal test<br>System–on chip testing
Abbrevation
VLSI-DAT
City
Hsinchu
Country
Taiwan
Deadline Paper
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