The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient testing methodologies and designs. The 15th workshop will feature ′′Testing in the high frequency world′′. <b>Keywords:</b> Analog/Mixed Circuit Testing, Automatic Test Generation, Built–In Self–Test (BIST), Board Level Testing, Defect Oriented Testing, Delay/Performance Testing, Design for Testability, Design Verification/Validation, Diagnosis and Debug, Embedded Core Testing, Fault Modeling/Simulation, IDDQ Testing, Multi–Chip Module Testing, Memory Testing, MEMS Testing, Online Testing, System–on–Chip (SOC) Test, System Testing, Test Economics, Test Quality/System Reliability, Test Resource Partitioning, Test Synthesis
Abbrevation
NATW
City
Essex JunctionVT
Country
United States
Deadline Paper
Start Date
End Date
Abstract