International Conference on Design & Test of Integrated Systems in nanoscale technology, Tunis, Tunesien

The aim of the international conference on Design & Test of Integrated Systems in nanoscale technology is to cope with the rapidly progressing electronic technology which reaches today the nanometer scale&#046; The area of interest deals with the design and test of electronic products, ranging from integrated circuits through multi&#8211;chip modules and printed circuit board to full systems and Microsystems, as well as examining the methodologies and tools used in the design of such products&#046; The official language of the conference is English and the conference is planned to be held every two years&#046; <b>Keywords:</b> Integrated System Design Integrated System Testing Integrated System Technology