The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of system, board and device testing with design, manufacturing and field considerations in mind. The official language of the symposium is English.Topics of interest include, but are not limited to: Automatic Test Generation / Fault Simulation Synthesis for Testability / Design for Testability Built–In Self–Test / On–line Testing Software Testing / Software Design for Testing Fault Modeling & Diagnosis Mixed–Signal Test Network Protocol Testing Design Verification Electron–Beam Testing Economics of Test Fault Tolerance IDDQ Test System–on–Chip Test <b>Keywords:</b> Automatic Test Generation / Fault Simulation Synthesis for Testability / Design for Testability Built–In Self–Test / On–line Testing Software Testing / Software Design for Testing Fault Modeling & Diagnosis Mixed–Signal Test Network Protocol Testing Design Verification Electron–Beam Testing Economics of Test Fault Tolerance IDDQ Test System–on–Chip Test
Abbrevation
ATS
City
Fukuoka
Country
Japan
Deadline Paper
Start Date
End Date
Abstract