Issues related to on–line testing are increasingly important in modern electronics systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost–effective on–line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. Nanometer technologies adversely impact noise margins and make integrating on–line test mandatory in many modern ICs. The Symposium is also emphasizing on–line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), co–organized by the TTTC On–line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory, and University of Bologna. <b>Keywords:</b> Reliability issues in nanometer technologies<br>Field diagnosis, maintainability and reconfiguration<br>Secure circuit design<br>On–line testing of analog and mixed signal circuits<br>On–line test in the continuous operation of large systems<br>On–line testing in automotive, railway and avionics<br>On–line testing in industrial control<br>Fault–based attacks and counter measures<br>Self–checking circuits and coding theory<br>On–line and off–line BIST<br>Synthesis of on–line testable circuits<br>Radiation effects<br>Fault–tolerant and fail–safe Systems<br>On–line power monitoring and control<br>On–line monitoring of current, temperature and other reliability indicators<br>Dependability evaluation<br>
Abbrevation
IOLTS
City
Lake of Como
Country
Italy
Deadline Paper
Start Date
End Date
Abstract