DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state–of–the–art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest. The Symposium will be held in Arlington/Washington DC, USA, at the Hilton Arlington & Towers Hotel. The hotel is located in the upscale Ballston area of Arlington, Virginia and is linked by skybridge to the Ballston Common Mall and NSF Office Complex. The Ballston neighborhood provides close proximity to high–tech engineering firms and government research offices <b>Keywords:</b> Yield Analysis, Modeling and Enhancement<br>Repair, Restructuring and Reconfiguration<br>Testing Techniques<br>Error Detection, Correction, and Recovery<br>Defect and Fault Tolerance<br>Dependability Analysis and Validation<br>Emerging Technologies<br>Safety Critical Systems<br>
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DFT
City
Arlington/Washington DC
Country
United States
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