The IEEE Wireless Test Workshop (WTW2006) is an IEEE–sponsored workshop devoted to exploring all issues relating to the design and especially test of wireless circuits and systems. The workshop will be held the day before the VLSI Test Symposium (VTS) 2006. <b>Keywords:</b> • Design–for–testability<br>• Wafer probing<br>• High frequency test<br>• Yield learning and analysis<br>• Wireless test methodology<br>• Case studies<br>• Wireless system test<br>• Embedded RF circuit test<br>• Standards conformance test<br>• Design characterization and validation<br>• Noise analysis and avoidance<br>• Design for Manufacturability<br>• Test board related issues<br>• Test equipment and metrology<br>• Test program development<br>• Cost of test<br>• Fault diagnosis and failure analysis<br>
Abbrevation
WTW
City
California
Country
United States
Deadline Paper
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