The joint conference will combine the IVNC and the IFES, the two major conferences on field ion and field electron emission and their applications in vacuum nanoelectronics. The conference will provide a forum for presenting and discussing newest developments in electron and ion sources, field emission microscopy, vacuum nanoelectronic devices and technologies, and FIM Atom Probe techniques. <b>Keywords:</b> Modeling, Simulation, Theory<br>• Theory of all forms of field–induced electron emission<br>• Field ionization, field evaporation and liquid–metal ion source theory<br>• Trajectories of charged particles, including near–emitter and beam optics<br>• Theory of operation of Atom–Probe FIM<br>• Theory of vacuum microelectronic devices<br>Atom–Probe and conventional Field Ion Microscopies<br>• Atom–Probe FIM and tomography, and their applications in material science, surface science and surface chemistry, including:<br>• New instrumental developments<br>• Recent advances in the collection and interpretation of data<br>• FIB–based and other novel specimen preparation techniques<br>• Conventional FIM techniques and their applications<br>Technologies and new materials for cold cathodes<br>• Preparation techniques and emitting characteristics for all forms of material that exhibit field–induced electron emission.<br>• Applications aspects: reliability, lifetime, emission noise, interactions with residual gases, ion bombardment, current limitations<br>Design, fabrication and characterization of vacuum microelectronic devices<br>• Microfabricated emitters and integrated electrodes, flat panel displays, etc.<br>• Display phosphors<br>• Microwave amplifiers, plasma devices, analytical instruments and sensors<br>• Novel applications<br>Related aspects of ion and electron emission<br>• Field electron microscopy and spectroscopy and their applications<br>• Liquid–metal ion sources and their applications<br>• Surface conductivity devices, novel forms of emitter<br>
Abbrevation
IVNC
City
Guilin
Country
China
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