The IEEE International Workshop on Current and Defect Based Testing (DBT 2006) is aimed at addressing these issues and others related to “Defect–Based or Data–Based Testing: What’s the difference?” Paper presentations on topics related to the workshop’s theme and to those given below are expected to generate active discussion on the challenges that must be met to ensure high IC quality through the end of the decade. <b>Keywords:</b> • Test Data Analysis<br>• Transition and Delay Testing<br>• IDDQ and IDDT Testing<br>• Low voltage Testing<br>• Data–Mining approaches for Test Data Processing • Elevated Voltage Testing and Stress Testing<br>• Reliability and Yield<br>• Noise and Cross–talk Testing<br>• Nanometer Test Challenges<br>• Defect Coverage & Metrics<br>• Mixed Current/Voltage Testing • Economics of Defect Based Testing<br>• Fault Localization & Diagnosis<br>• Outlier Identification<br>• Data–Based Testing<br>
Abbrevation
DBT
City
Santa Clara
Country
United States
Deadline Paper
Start Date
End Date
Abstract