Semiconductor Equipment and Materials International (SEMI), IEEE Electron Devices Society (EDS) and IEEE Components, Packaging, and Manufacturing Technology Society (CPMT) invite microelectronic manufacturing professionals at all levels of experience from around the world to submit abstracts to ASMC 2007. ASMC is one of the leading international technical conferences for discussing solutions that improve the semiconductor manufacturing process. The conference provides unparalleled opportunities for semiconductor professionals from industry, academia and consortiums to network and learn the latest in the practical application of advanced manufacturing strategies and all methodologies used to achieve manufacturing excellence. Papers are peer–reviewed and selected based on a clear outline of problems, analysis, solution/results and conclusions.<br><b>Keywords:</b> ● Advanced Metrology<br>● Design for Manufacturability (DFM)<br>● Advanced Processes and Materials<br>● Factory Automation and Dynamics<br>● Advanced Process Control<br>● Industrial Engineering<br>● Analog, High–Power and High–Voltage<br>● Lithography Advances/Challenges<br>● Contamination Free Manufacturing (CFM)<br>● Time to Market<br>● Cost Reduction, Equipment Reliability and Productivity<br>● Yield Modeling and Enhancement<br>● Data Management and Data Mining Tools<br>● 300mm Prime Initiative<br>● Defect Inspection and Reduction<br>
Abbrevation
ASMC
City
Milan
Country
Italy
Deadline Paper
Start Date
End Date
Abstract