The 2007 International ESD Workshop will focus on robust design and test of ESD protection for state–of–the–art integrated circuits as well as advanced semiconductor system on chip (SOC) and system in package (SIP) applications. Through the technical presentations solicited here, as well as invited seminars, un–refereed poster sessions, discussion groups and special interest groups, a unique and informal environment is provided for understanding and sharing ESD technology. All workshop activities take place in a relaxed and rustic setting that promotes an atmosphere of interactive learning and helpful discussions. The International ESD Workshop (IEW) is closely aligned with the EOS/ESD Symposium for collaborative conference activities. In addition, the IEW will be very similar in format and held at the same location as the IEEE Integrated International Reliability Workshop.<br><b>Keywords:</b> Novel Design Concepts<br>Special Custom Design<br>Technology Integration Issues<br>Failure Analysis<br>Test Structures<br>Simulation Tools<br>ESD Testing<br>ESD Characterization<br>System Level ESD Issues<br>Unresolved ESD Issues<br>
Abbrevation
IEW
City
Lake Tahoe
Country
United States
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