Abbrevation
DDECS
City
Kraków
Country
Poland
Deadline Paper
Start Date
End Date
Abstract

The IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of microelectronic circuits and systems&#046;<br>The DDECS Workshop series is organised by Central European countries: Czech Republic (1997, 2002, 2006), Poland (1998, 2003), Slovakia (2000, 2004) and Hungary (2001, 2005)&#046;<br>DDECS 2007 is organised by the Institute of Electronics, Silesian University of Technology in Gliwice and is sponsored by the IEEE Computer Society – Test Technology Technical Council (TTTC)&#046; <b>Keywords:</b> &#56256;&#56457; ASIC/FPGA Design<br>&#56256;&#56457; Bio&#8211;inspired Hardware<br>&#56256;&#56457; Design Verification/Validation<br>&#56256;&#56457; Formal Methods in System Design<br>&#56256;&#56457; Hardware/Software Co&#8211;Design<br>&#56256;&#56457; IP&#8211;based Design<br>&#56256;&#56457; Logic Synthesis<br>&#56256;&#56457; Physical Design<br>&#56256;&#56457; Reconfigurable Computing<br>&#56256;&#56457; System&#8211;on&#8211;a&#8211;Chip (SoC)<br>&#56256;&#56457; Analog, Mixed&#8211;Signal, and RF Test<br>&#56256;&#56457; ATE Hardware and Software<br>&#56256;&#56457; Built&#8211;in Self&#8211;Test (BIST)<br>&#56256;&#56457; Design for Testability and Diagnosis<br>&#56256;&#56457; Defect/Fault Tolerance and Reliability<br>&#56256;&#56457; Embedded Test<br>&#56256;&#56457; Memory and Processor Test<br>&#56256;&#56457; MEMS Testing<br>