The IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era DTIS’07 explores emerging challenges and novel concepts in design, test and technology of electronic products ranging from integrated circuits through multi–chip modules and printed circuit boards to full systems and microsystems, as well as examining the methodologies and tools used in the design, verification and validation of such products. DTIS aims to cope with the rapidly progressing electronic technology, which reaches the nanometer scale today. DTIS’07 will take place in Rabat, Morocco. It will be organized by the Delft University of Technology; it is technically co–sponsored by the IEEE Circuits and Systems Society. The official language of the conference is English. <b>Keywords:</b> Integrated System Design<br>• SOC, SIP design • Multiprocessor systems • Embedded systems • Network on Chip • Analog, Mixed Sig. and RF systems • MEMS and MOEMS systems • Low Voltage and Low Power syst. • Innovative technologies • Synthesis (physical, logic,...) • Simulation, Validation & Verification<br>Integrated System Testing<br>• SOC and SIP testing • Multiprocessor systems • Memory Test • Delay testing • Analog and Mixed Signal testing • MEMS/MOEMS testing • Defect and fault modeling • DFT, BIST and BISR • On–line testing / fault tolerant syst. • Fault Simulation, ATPG<br>Integrated System Technology<br>• Device modeling • Material characterization • Failure analysis • New components • Packaging • Process technology • Reliability issues • Circuit integrity<br>
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DTIS
City
Rabat
Country
Morocco
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