Abbrevation
ITSW
City
Santa Barbara
Country
United States
Start Date
End Date
Abstract
Design–for–Test continues to be a challenge with shrinking time–to–market windows, shrinking device geometries and increasing transistor densities. International Test Synthesis Workshop (ITSW) is a premier forum designed to share and exchange ideas, issues and best practices on the implementation of Design–for–Test (DFT) features in today′s complex ICs and System–on–a–Chip (SOC) designs. <b>Keywords:</b>