Abbrevation
IRPS
City
Phoenix
Country
United States
Deadline Paper
Start Date
End Date
Abstract

covering state&#8211;of&#8211;the&#8211;art developments in electronic and optoelectronic reliability&#046; Attendees returning from IRPS will be better equipped to solve critical reliability problems and develop effective qualification procedures that affect their companies’ bottom line&#046; <b>Keywords:</b> Product Reliability and Burn&#8211;in<br>Non&#8211;Volatile Memory<br>Qualification Strategies<br>Circuits<br>Assembly and Packaging<br>Failure Analysis<br>MEMS<br>Device and Process<br>Transistor<br>Interconnects<br>Device Dielectrics<br>ESD and Latch&#8211;Up<br>Process Induced Damage<br>Nanoelectronic Device Reliability<br>