Abbrevation
IRPS
Link
City
Phoenix
Country
United States
Deadline Paper
Start Date
End Date
Abstract
covering state–of–the–art developments in electronic and optoelectronic reliability. Attendees returning from IRPS will be better equipped to solve critical reliability problems and develop effective qualification procedures that affect their companies’ bottom line. <b>Keywords:</b> Product Reliability and Burn–in<br>Non–Volatile Memory<br>Qualification Strategies<br>Circuits<br>Assembly and Packaging<br>Failure Analysis<br>MEMS<br>Device and Process<br>Transistor<br>Interconnects<br>Device Dielectrics<br>ESD and Latch–Up<br>Process Induced Damage<br>Nanoelectronic Device Reliability<br>