<p align=″justify″>The main target of the IEEE East–West Design & Test Symposium (EWDTS) is to exchange experiences in the field of design, design automation and test of electronic circuits and systems, between the technologists and scientists from Eastern and Western Europe, as well as North America and other parts of the world, The symposium aims at attracting attendees especially from the Newly Independent States (NIS) and countries around the Black Sea and Central Asia.</p><br><b>Keywords:</b> • Analog, Mixed–Signal and RF Test<br>• Analysis and Optimization<br>• ATPG and High–Level TPG<br>• Built–In Self Test<br>• Debug and Diagnosis<br>• Defect/Fault Tolerance and Reliability<br>• Design and Test<br>• Design for Testability<br>• Design Verification and Validation<br>• EDA Tools for Design and Test<br>• Embedded Software Performance<br>• Failure Analysis, Defect and Fault<br>• FPGA Test<br>• High–level Synthesis<br>• High–Performance Networks and Systems on a Chip<br>• Low–power Design<br>• Memory and Processor Test<br>• Modeling & Fault Simulation<br>• Modeling and Synthesis of Embedded Systems<br>• Object–Oriented System Specification and Design<br>• On–Line Test<br>• Power Issues in Testing<br>• Real Time Embedded Systems<br>• Reliability of Digital Systems<br>• Scan–Based Techniques<br>• Self–Repair and Reconfigurable Architectures<br>• System Level Modeling, Simulation & Test Generation<br>• Using UML for Embedded System Specification<br>
Abbrevation
EWDTS
City
Yerevan
Country
Armenia
Start Date
End Date
Abstract