<P>The IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of microelectronic circuits and systems.<BR><B>Keywords:</B> ��</P> <TABLE width=″100%″ border=0> <TBODY> <TR> <TD width=″50%″> <UL> <LI>ASIC/FPGA Design <LI>Bio–inspired Hardware <LI>Design Verification/Validation <LI>Formal Methods in System Design <LI>Hardware/Software Co–Design <LI>IP–based Design <LI>Logic Synthesis <LI>Physical Design <LI>Reconfigurable Computing </LI></UL></TD> <TD width=″50%″> <UL> <LI>System–on–a–Chip (SoC) <LI>Analog, Mixed–Signal, and RF Design and Test <LI>ATE Hardware and Software <LI>Built–in Self–Test (BIST) <LI>Design for Testability and Diagnosis <LI>Defect/Fault Tolerance and Reliability <LI>Embedded Test <LI>Memory and Processor Test <LI>MEMS Testing </LI></UL></TD></TR></TBODY></TABLE>
Abbrevation
DDECS
City
Bratislava
Country
Slovakia
Deadline Paper
Start Date
End Date
Abstract