3rd International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Tozeur, Tunesien

Abbrevation

DTIS

Link

http://www.emc-lab.net/Conferences/DTIS2008/

City

Tozeur

Country

Tunisia

Deadline Paper

2007-10-28

Start Date

2008-03-25

End Date

2008-03-27

Abstract

<P class=Style117 align=justify>The aim of the IEEE DTIS international conference is to cope with the rapidly progressing electronic technology which is today reaching the nanometer scale.</P> <P class=Style117 align=justify>The main area of interest deals with the design, technology and test of electronic products, ranging from integrated circuits through multi–chip modules and printed circuit board to full systems and Microsystems, as well as examining the methodologies and tools used in the design and fabrication of such rapidly growing products.</P> <P class=Style117 align=justify> <B>Keywords:</B> </P> <P class=″Style9 style34 Style38″>Integrated System Design :</P> <P class=Style117 align=justify> <TABLE width=403 border=0> <TBODY> <TR> <TH class=Style41 scope=row align=left width=393><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> SOC, SIP design</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Multiprocessor systems</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Embedded systems</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Wireless systems</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Network on Chip</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Analog, Mixed Signal and RF systems</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> MEMS and MOEMS systems</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Low Voltage and Low Power systems</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Innovative technologies</TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Synthesis (physical, logic,...) </TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> Simulation, Validation and Verification</TH></TR></TBODY></TABLE></P> <P class=″style35 style36 Style43 Style38″>Integrated System Testing : </P> <P class=Style117 align=justify> <TABLE width=404 border=0> <TBODY> <TR> <TH class=Style41 scope=row align=left width=394><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> D<STRONG>efect and fault modelling </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Analog and Mixed Signal testing </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><STRONG><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> MEMS/MOEMS testing</STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>SOC and SIP testing </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Delay testing </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9><STRONG> Memory testing </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Fault Simulation, ATPG </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>DFT, BIST and BISR </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>On–line testing and fault tolerant systems </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>ATE issues </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Alternative test strategies </STRONG></TH></TR></TBODY></TABLE></P> <P class=Style44>Integrated System Technology : </P> <P class=Style117 align=justify> <TABLE width=405 border=0> <TBODY> <TR> <TH class=Style41 scope=row align=left width=395><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Device modeling </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Material characterization </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Failure analysis </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>New components </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Packaging </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Process technology </STRONG></TH></TR> <TR> <TH class=Style41 scope=row align=left><IMG height=12 src=″http://www.emc–lab.net/Conferences/DTIS2008/images/FLAT…; width=9> <STRONG>Reliability issues</STRONG></TH></TR></TBODY></TABLE></P>