It is my great pleasure to announce this meeting, the 62nd consecutive Frequency Control Symposium, one of the leading international technical conferences for research, development, and applications of frequency control. The 2008 IEEE International Frequency Control Symposium (FCS) will offer attendees and exhibitors a unique opportunity to interrelate both technically and socially. <B>Keywords:</B> Group 1 Materials, Filters & Resonators<BR>A. Material Synthesis and Properties<BR>B. Theory and Design of Resonators and Filters–<BR>BAW, SAW, FBAR, MEMS, NEMS and others<BR>Group 2 Oscillators, Synthesizers, & Noise<BR>A. Oscillators – BAW and SAW<BR>B. Oscillators – Microwave to Optical<BR>C. Synthesizers and Other Circuitry<BR>D. Noise, Aging, and Environmental Effects<BR>E. Measurements and Specifications<BR>F. Timing Error in Digital Systems and Applications<BR>Group 3 Timekeeping, Optical & Microwave Atomic Standards<BR>A. Optical Atomic Standards and Frequency Combs<BR>B. Microwave Atomic Frequency Standards<BR>C. Atomic Clocks for Space Applications<BR>D. TAI and Time Scales<BR>E. Frequency and Time Transfer and Synchronization<BR>F. Fundamental Physics, Fundamental Constants, & Other Applicat ions<BR>Group 4 Sensors & Transducers<BR>A. Resonant Chemical Sensors<BR>B. Resonant Physical Sensors<BR>C. BAW, SAW, FBAR, and MEMS Sensors<BR>D. Transducers<BR>E. Sensor Instrumentation and Wireless Sensors
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FCS
City
Honolulu, HI
Country
United States
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