<P>Troubleshooting how and why systems and circuits fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for R&D, or just getting a working first prototype. This detective work can however become very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time–to–market, the traditional focus on only pass/fail testing and missing tool and equipment capabilities. New and efficient solutions for debug and diagnosis will have a much needed and highly visible impact on productivity. </P> <P align=justify>SDD08 will be held in San Diego, California, USA. It is the fifth in a series of highly successful technical workshops. Its mission and objective is to consider all issues related to debug and diagnosis of systems and circuits – from prototype bring–up to volume production.</P> <P align=justify><B>Keywords:</B></P> <P> <TABLE width=650 align=center> <TBODY> <TR> <TD>Debug Techniques and Methodologies</TD> <TD>Microprocessor, FPGA, IP, SOC Debug</TD></TR> <TR> <TD>Design and Synthesis for Debug</TD> <TD>Infrastructure IP for SDD</TD></TR> <TR> <TD>DFT Reuse for Debug and Diagnosis</TD> <TD>System Level Debug & Diagnosis</TD></TR> <TR> <TD>Debug & Diagnosis Architectures</TD> <TD>Manufacturing & Prototype Environment</TD></TR> <TR> <TD>Tools</TD> <TD>Equipment Impact and Techniques</TD></TR> <TR> <TD>Debug Standardization</TD> <TD>Cross–geography turn–on, debug & diagnosis issues</TD></TR> <TR> <TD>SDD vs. Yield & TTM</TD> <TD>Digital/Analog Turn–on</TD></TR> <TR> <TD>Case studies</TD></TR></TBODY></TABLE></P>
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SDD
City
San Diego
Country
United States
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