IEEE Circuits and Systems International Conference on T esting and Diagnosis, Chengdu, China

Abbrevation

ICTD

Link

http://ictd08.uestc.edu.cn/

City

Chengdu

Country

China

Deadline Paper

2008-06-15

Start Date

2008-10-25

End Date

2008-10-26

Abstract

We are delighted to announce that the 2008 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD′08), sponsored by IEEE Circuit and System Society (CAS), will be held on 25th –26th Oct. 2008 in Chengdu P. R. China. Keywords: <LI>ATE/TPS Techniques <LI>Next Generation Instruments and Systems <LI>Board and System Test and Diagnosis <LI>System–on–Chip test <LI>RF/MW/MM Test and Instrument <LI>Data Acquisition <LI>Monitoring,Diagnosis and Prognostics methods <LI>Design–for–Test(DFT) <LI>BIT/BIST <LI>Test Generation <LI>Fault Tolerance <LI>Mixed–Signal and Analog Test <LI>High–Speed Digital Test <LI>Fault Model and Fault Simulation <LI>Optoelectronics Test <LI>Reliability and Design for Reliability <LI>Diagnosis for Analog Circuits <LI>Test and Diagnosis for Submicron Circuits <LI>Test and Diagnosis of Biomedical CAS <LI>Other Related Topics </LI>