Abbrevation
DATE
City
Nice
Country
France
Deadline Paper
Start Date
End Date
Abstract

<P>The 12th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems&#046; It puts strong emphasis on ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software&#046;</P> <P><B>Keywords:</B> </P> <P align=left>Track D: Design Methods, Tools, Algorithms and Languages<BR>D1 System Specification and Modelling<BR>D2 MPSoC and System Design Methods<BR>D3 System Synthesis and Optimisation<BR>D4 Simulation and Validation<BR>D5 Design of Low Power Systems<BR>D6 Power Estimation and Optimisation<BR>D7 Emerging Technologies, Systems and Applications<BR>D8 Formal Methods and Verification<BR>D9 Network on Chip<BR>D10 Architectural and Microarchitectural Design<BR>D11 Architectural Synthesis<BR>D12 Reconfigurable Computing<BR>D13 Logic and Technology Dependent Synthesis for Deep&#8211;Submicron Circuits<BR>D14 Physical Design and Verification<BR>D15 Analogue and Mixed&#8211;Technology Circuits and Systems<BR>D16 CAD for Analogue and Mixed&#8211;Signal Design<BR>D17 Interconnect, EMC and Packaging Modelling</P> <P align=left><BR>Track A: Application Design<BR>A1 Media and Signal Processing<BR>A2 Wireless Communication and Networking<BR>A3 Automotive<BR>A4 Secure Embedded Implementations<BR>A5 Military, Space and Avionics Systems<BR>A6 Application of Reconfigurable and Adaptive Systems<BR>A7 Technologies and Applications for Healthcare<BR>A8 Multi&#8211;core Platforms<BR>A9 MEMS and Mixed&#8211;Signal System Implementations</P> <P align=left><BR>Track T: Test Methods, Tools and Innovative Experiences<BR>T1 System and Industrial Test<BR>T2 Design for Test and BIST<BR>T3 Test Generation, Simulation and Diagnosis<BR>T4 On&#8211;Line Testing and Fault Tolerance<BR>T5 Test for Variability, Reliability and Defects<BR>T6 Mixed&#8211;Signal/RF/MEMS Test and DFX Engineering</P> <P align=left><BR>Track E: Embedded Systems Software <BR>E1 Real&#8211;time, Networked and Dependable Systems – principles and practice<BR>E2 Compilers and Code Generation for Embedded Systems<BR>E3 Model&#8211;based Design for Embedded Systems<BR>E4 Software Architectures and Principles for Embedded MPSoC and Multicore</P>