International Test Conference, Santa Clara, Vereinigte Staaten

Abbrevation

ITC

Link

http://www.itctestweek.org/

City

Santa Clara

Country

United States

Deadline Paper

2008-07-07

Start Date

2008-10-28

End Date

2008-10-30

Abstract

International Test Conference, the cornerstone of TestWeek(tm), is the world′s premier conference dedicated to the electronic test of devices, boards and systems–covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. Conference Focus Topics: Adaptive Test BIST or Embedded Test—Chip and Board Bring–up Test and Silicon Debug Design and Test for Reliability Experiments and Case Studies High–Speed Digital Test Low–Cost Test/ATE On–Chip Test Compression On–line Test RF Testing Test Data Analysis Test for Nanometer Technologies Test Resource Partitioning Hot Topics: Board and System Test Defect–based Testing High–Speed I/O Test Innovative Industrial Test Practice Power Issues in Test Test and Design for Manufacturability Volume Diagnosis and Yield Learning Regular Topics: ATE Hardware and Software ATPG, Test Synthesis Boundary–Scan Design–for–Test: Chip, Board and System Economics of Test FPGA Test IDDQ and Current Test Interface Issues Loadboard Design and Simulation MCM and KGD Test Memory Test Microprocessor Test Mixed–Signal and Analog Test Multisite Test Production Test Automation System–on–Chip Test System–in–Package Test Test Standards Test Effectiveness Wafer Probe