Abbrevation
SPIE Scanning Microscopy
Link
http://spie.org/scanning.xml
City
Monterey
Country
United States
Deadline Paper
Start Date
End Date
Abstract

<P class=style2> <TABLE width=&#8243;100%&#8243; border=0> <TBODY> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Agricultural applications </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Backscattering electron diffraction</A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Electron beam specimen interaction workshop </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Focused ion beam (FIB) </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Helium ion microscopy </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Food analysis: microstructure, identification and counter&#8211;terrorism </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Forensics applications </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Graphic arts aspects of microscopy </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Light microscopy </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Materials microscopy and microanalysis </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Medical applications of scanning microscopy </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Microanalysis in SEM/EPMA/AEM </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Microscopy and microanalysis: theory, instru&#8211; mentation and techniques </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Microwave preparation technology </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Monte Carlo modeling for microscopy and microanalysis </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Multidimensional microscopy </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Museum applications</A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Nanotechnology and nanofabrication </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Scanning cryo&#8211;HRSEM of chemical systems </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Scanning probe microscopies </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>Semiconductor devices, materials, and process characterization </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>STEM </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>TEM </A /></TD></TR> <TR> <TD vAlign=top align=right width=5> •</TD> <TD>X&#8211; ray mapping in electron beam instruments</TD></TR></TBODY></TABLE></P>