<P>One and a half decade ago the IEEE Mixed–Signal Test Workshop (IMSTW) was inaugurated as a forum focused on test and design for test issues related to systems encompassing digital and analog electrical signals. In view of accelerated developments in heterogeneous design and production, in 2008 IMSTW started to include new topics focusing on challenges and solutions associated with test, design for test, reliability and manufacturability of heterogeneous types of systems in emergence or envisaged in the near to longer terms. Renamed to include sensors and systems, the new IMS3TW aims to bring research and technical expertise for the next generation of devices, circuits and systems. IMS3TW will continue to address the traditional technology spectrum of IMSTW, in particular all aspects of analog, mixed–signal, and RF testing, but with increased attention to all aspects of current design complexity (e.g., parametric variability, power consumption, temperature effects). Guaranteeing design robustness for the new generation of nanoelectronic devices may need to exploit self–monitoring functionality (such as selftest/– calibration), allowing the circuit or system to adapt to varying circuit parameters or functional demands. Builtin sensors can play a crucial role to facilitate device adaptability and are therefore within the scope of IMS3TW.</P> <P align=left><STRONG>Primary Topics of Interest include: <BR><BR> <TABLE cellSpacing=0 cellPadding=0 width=″95%″ border=0> <TBODY> <TR> <TD vAlign=top width=249>Test & Design for (on/off–line) Test </TD> <TD vAlign=top width=314> <P>Verification & Design for Verification</P></TD></TR> <TR> <TD vAlign=top width=249> <P>Reliability & Design for Reliability</P></TD> <TD vAlign=top width=314> <P>Monitoring/Diagnosis & Design for Debug/Diagnosis</P></TD></TR> <TR> <TD vAlign=top width=249> <P>Fault and Error Modelling & Simulation</P></TD> <TD vAlign=top width=314> <P>Fault Tolerance</P></TD></TR></TBODY></TABLE><BR><STRONG>Pertaining to the following systems or underlying technologies:</STRONG> <BR><BR> <TABLE cellSpacing=0 cellPadding=0 width=″95%″ border=0> <TBODY> <TR> <TD vAlign=top width=268>Analog/Mixed–Signal Circuits<BR>Biomedical Circuits & Systems </TD> <TD vAlign=top width=337> <P>Lab–on–Chip<BR>MEMs</P></TD></TR> <TR> <TD vAlign=top width=268> <P>RF & Wirelessly Controlled Devices</P></TD> <TD vAlign=top width=337> <P>Microfluidics</P></TD></TR> <TR> <TD vAlign=top width=268> <P>Optoelectronics & Photonics</P></TD> <TD vAlign=top width=337> <P>Heterogeneous Systems</P></TD></TR> <TR> <TD vAlign=top width=268> <P>Drug Delivery Microsystems</P></TD> <TD vAlign=top width=337> <P>Implantable Devices</P></TD></TR></TBODY></TABLE></STRONG></P>
Abbrevation
IMS3TW
City
Scottsdale
Country
United States
Deadline Paper
Start Date
End Date
Abstract