Abbrevation
VTS
City
Santa Cruz
Country
United States
Deadline Paper
Start Date
End Date
Abstract

<span class=&#8243;h1&#8243;>The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems&#046;</span> <br class=&#8243;short&#8243;> The VTS Program Committee invites original, unpublished paper submissions for VTS 2009&#046; Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two&#8211;column format; papers exceeding the page limit will be returned without review&#046; Authors should clearly explain the significance of the work, highlight novel features, and describe its current status&#046;<br>