Abbrevation
VTS
City
Santa Cruz
Country
United States
Deadline Paper
Start Date
End Date
Abstract
<span class=″h1″>The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems.</span> <br class=″short″> The VTS Program Committee invites original, unpublished paper submissions for VTS 2009. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two–column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.<br>