International Workshop On Memory Technology, Design And Testing, Hsinchu, Taiwan

Following the traditions set up by its predecessors, MTDT09 will provide a forum dedicated to the recent advancements of the memory technology, covering topics such as memory device, circuit design, architecture, fabrication process, verification, yield analysis testing/diagnosis/repair for all kinds of memory such as SRAM, DRAM, Flash memory, EPROM, EEPROM, embedded memories, 3–D memories, content addressable memories, etc.