<P>During the last fourteen years, the IEEE Workshop on Signal Propagation on Interconnects has been developed into a <STRONG>forum of exchange</STRONG> on the latest research and developments in the field of interconnect modeling, simulation and measurement at chip, board, and package level. <BR><BR>In view of the last years success the committee is looking forward to the <STRONG>15th IEEE Workshop on Signal Propagation on Interconnects</STRONG> where world class developers and researchers will share and discuss leading edge results in Naples, Italy. <BR><BR>The Workshop will take place in the wonderful location of <STRONG>"Convention Center Federico II"</STRONG> in the waterfront of Naples, in front of the old harbor and the ancient Castle "Dell′Ovo", with a breathless view of the gulf and the Vesuvio.</P> <H3 align=left><FONT color=#ffcc00><STRONG>TOPICS</FONT></STRONG></H3> <P> <TABLE cellSpacing=0 cellPadding=0 width="100%" border=0> <TBODY> <TR> <TD>High–speed Interconnects</TD> <TD>Power Distribution Networks</TD></TR> <TR> <TD>Electronic packages and microsystems</TD> <TD>Optical Interconnects</TD></TR> <TR> <TD>RF, Microwave and Wireless Interconnects</TD> <TD>Nano–Interconnects and nano–Packages</TD></TR> <TR> <TD>Electromagnetic Theory and Modeling</TD> <TD>Transmission Line Theory and Modeling</TD></TR> <TR> <TD>Macro–Modeling, reduced–order models</TD> <TD>Advanced Simulation Tools for Modeling Interconnects Structures</TD></TR> <TR> <TD>Signal Integrity on High–Speed Interconnects</TD> <TD>Power Integrity/ Ground Noise</TD></TR> <TR> <TD>Advanced Simulation Tools for Modeling Interconnects Structures</TD> <TD>Electromagnetic Compatibility</TD></TR> <TR> <TD>Coupling Effects on Interconnects</TD> <TD>Radiation & Interference )</TD></TR> <TR> <TD>Substrate Effects</TD> <TD>Testing & Interconnects</TD></TR> <TR> <TD>Frequency Domain Measurement Techniques</TD> <TD>Time Domain Measurement Techniques</TD></TR></TBODY></TABLE></P>
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Naples
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Italy
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