<SPAN style="FONT–FAMILY: Arial; COLOR: white; FONT–SIZE: 12pt; language: EN"><SPAN style="FONT–FAMILY: Arial; COLOR: white; FONT–SIZE: 12pt; language: EN"><FONT style="BACKGROUND–COLOR: #ffffff" color=#000000><SPAN style="FONT–FAMILY: Arial; COLOR: white; FONT–SIZE: 12pt; language: EN"><SPAN style="FONT–FAMILY: Arial; COLOR: white; FONT–SIZE: 12pt; language: EN"><FONT style="BACKGROUND–COLOR: #ffffff" color=#000000><SPAN lang=EN–GB> <P>This event provides a unique forum to discuss novel approaches in design, automation and test in the Middle East and Africa (MEA) region for researchers and practitioners in the areas of VLSI design, test and fault tolerance to come together to discuss new research ideas and present new research results. This event will provide the only VLSI Design & Test–specific meeting in the MEA region. Workshop topics include all aspects of design, test and automation. Specific topics are to include:</P> <DIV class=home> <DIV class="floatl width"> <UL> <LI>System Specification and Modelling</LI> <LI>System Design Methods</LI> <LI>SOC/NOC/MPSOC</LI> <LI>Quantum MEMs</LI> <LI>Architectures and Nanotechnology Architecture</LI> <LI>Reconfigurable Computing</LI> <LI>Emerging Technologies, Systems and Applications</LI> <LI>Architectural and Logic synthesis</LI> <LI>Design of Low Power Systems and Power Analysis</LI> <LI>Packaging</LI> <LI>Design Verification and Formal Methods</LI> <LI>Mixed–Signal and RF Design</LI> <LI>IC Physical Design Automation</LI> <LI>Test Generation, Simulation and Diagnosis</LI> <LI>Design For Test</LI> <LI>Embedded Systems</LI> <LI>Real Time Systems</LI></UL></DIV> <DIV class="floatr width"> <UL> <LI>Defect–Based Test</LI> <LI>Fault Modeling</LI> <LI>Test Issues in Nanotechnology</LI> <LI>Built–In Self Test (BIST)</LI> <LI>Design for Manufacturability (DFM)</LI> <LI>Automatic Test Equipment</LI> <LI>Analog and Mixed–Signal Test</LI> <LI>On–Line Testing</LI> <LI>Test Resource Partitioning</LI> <LI>Failure Analysis</LI> <LI>Fault Tolerance</LI> <LI>Economics of Test</LI> <LI>Applications Design: Media, Signal Processing, Wireless Communication and Networking, Automotive, Military, Secure Embedded Implementations, etc</LI></UL></DIV></DIV></SPAN></FONT></SPAN></SPAN></FONT></SPAN></SPAN>
Abbrevation
IDT
City
Beirut
Country
Lebanon
Deadline Paper
Start Date
End Date
Abstract