12th IEEE Latin-American Test Workshop, Porto de Galinhas, Brasilien

Abbrevation

LATW

Link

http://www.feng.pucrs.br/~sisc/LATW/2011.html

City

Porto de Galinhas

Country

Brazil

Deadline Paper

2010-11-19

Start Date

2011-03-27

End Date

2011-03-30

Abstract

The Latin–American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board and component testing and fault–tolerance with design, manufacturing and field considerations in mind. – Analog Mixed Signal Test – Automatic Test Generation – Built–In Self–Test – Defect–Based Test – Design and Synthesis for Testability – Design for Electromagnetic Compatibility – Design for Reliable Embedded Software – Economics of Test – Fault Analysis and Diagnosis – Fault Modeling and Simulation – Fault–Tolerance in HW/SW – Fault–Tolerant Architectures – Memory Test and Repair – On–Line Testing – Process Control and Measurements – Radiation/EMI – Hardening Techniques – Software Fault–Tolerance – Software On–Line Testing – System–on–Chip Test – Test Resource Partitioning