The <strong>IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems</strong> provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of nanoelectronic circuits and systems. The symposium also offers an insight into relevant European R&D collaborative programs, projects, and technology platforms.<br>Topics of interest include but are not limited to:<br>ASIC/FPGA Design<br>SoC and NoC Design and Test<br>Bio–Inspired Hardware<br>Design Verification/Validation<br>Formal Methods in System Design<br>Hardware/Software Co–Design<br>IP–based Design<br>Logic Synthesis<br>Physical Design<br>Defect/Fault Tolerance and Reliability<br>Analog, Mixed–Signal, RF Design and Test<br>Built–in Self–Test and Self–Repair<br>Design for Testability and Diagnosis<br>On–line Testing<br>Embedded Systems Testing<br>Memory, Processor Testing<br>MEMS Testing<br>Design and Test in Nano–Technologies<br>ATE Hardware and Software<br>Dependable HW/SW Systems<br>
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DDECS
City
Tallinn
Country
Estonia
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