Abbrevation
CT
City
MontrealQC
Country
Canada
Deadline Paper
Start Date
End Date
Abstract

Combinatorial Testing (CT) is a widely applicable generic methodology and technology for software verification and validation&#046; In a combinatorial test plan, all interactions between parameters up to a certain level are covered&#046; Studies show that CT can significantly reduce the number of test cases while remaining very effective for fault detection&#046; This workshop aims to bring together researchers, developers, users, and practitioners to discuss and exchange ideas and experiences in the development and application of CT methods, techniques, and tools&#046;<br>We invite submissions of high&#8211;quality papers presenting original work on both theoretical and experimental aspects of combinatorial testing&#046; Topics of interest include, but are not limited to:<br>&#8211; Combinatorial testing workflow<br>o Modeling the input space for CT<br>o Efficient algorithms to generate t&#8211;way test suites, especially involving support of constrains<br>o Determination of expected system behavior for each test case<br>o Executing CT test suites<br>o Combinatorial testing based fault localization<br>o Implementation of CT with existing testing infrastructures<br>o Handling changes in test requirements<br>&#8211; Applicability of combinatorial testing<br>o Comparison and combination of CT with other dynamic verification methods<br>o Investigation of historical records of failures to determine the kind of CT which may have detected underlying faults<br>o Empirical studies and feedback from practical applications of CT<br>o Combinatorial testing for concurrent and real&#8211;time systems<br>o CT for testing cloud computing systems and use of combinatorial methods in cloud architecture<br>o Application of CT in other domains, e&#046;g&#046;, study of gene regulation and other biotechnology applications<br>&#8211; Combinatorial and complementing methods<br>o Combinatorial analysis of existing test suites<br>o Test plan reduction and completeness<br>o CT and coverage metrics – combining the two, and studying the relationship between them<br>