IEEE Latin-American Test Workshop, Cordoba, Argentinien

Abbrevation

LATW

Link

http://www-elec.inaoep.mx/LATW2012/

City

Cordoba

Country

Argentina

Deadline Paper

2012-11-26

Start Date

2013-04-02

End Date

2013-04-05

Abstract

The IEEE Latin–American Test Workshop (LATW) provides an annual forum for test and fault tolerance professionals and technologists from all over the world and in particular from Latin America to present and discuss various aspects of system, board, and component testing and fault–tolerance with design, manufacturing and field considerations in mind. Presented papers are also published in the IEEE Xplore Digital Library. The best papers of the 14th IEEE LATW will be invited to re–submit to the IEEE Design and Test of Computers, Journal of Electronic Testing: Theory and Applications (JETTA) and the Journal of Low Power Electronics (JOLPE). Topics of interest include but are not limited to: – Analog Mixed Signal Test – Automatic Test Generation – Built–In Self–Test – Defect–Based Test – Design and Synthesis for Testability – Design for Electromagnetic Compatibility – Design for Reliable Embedded Software – Design Verification/Validation – Economics of Test – Fault Analysis and Diagnosis – Fault Modeling and Simulation – Fault–Tolerance in HW/SW – Fault–Tolerant Architectures – Memory Test and Repair – On–Line Testing – Process Control and Measurements – Radiation/EMI – Hardening Techniques – Software Fault–Tolerance – Software On–Line Testing – System–on–Chip Test – Test Resource Partitioning – Yield Optimization