Asian Test Symposium, Yilan, Taiwan

Abbrevation

ATS

Link

http://www.eng.auburn.edu/~agrawvd/CONF/ATS13/ATS_CfP_120831.pdf

City

Yilan

Country

Taiwan

Deadline Paper

2013-05-24

Start Date

2013-11-18

End Date

2013-11-22

Abstract

The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and ï¬eld consideration in mind. Original papers on, but not limited to, the following areas are invited. – Automatic Test Pattern Generation – Fault Modeling and Simulation – Design Veriï¬cation and Validation – Diagnosis and Debug – Board and System Test – Analog/Mixed–Signal Test – High–Speed I/O Test – RF Test – Delay and Performance Test – Memory Test/FPGA Test – System–in–Package/3D Test – Software Testing – Boundary Scan Test – Built–In Self–Test – Design–for–Testability – Test Compression – On–Line Test – Temperature/Power–Aware Testing – Defect–Based Testing – Fault Tolerance – Dependable System – Yield Analysis and Enhancement – Test Quality – Economics of Test